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PRODUCT INNOVATIONS
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Linear Technology - Hot Swap controller
Integrated 2Amp MOSFET & sense resistor provides compact hot swap solution
Linear Technology introduces the LTC4217, a 2A integrated Hot Swap controller for protecting low power boards with load supply voltages ranging from 2.9V to 26.5V. Like other Hot Swap devices, the LTC4217 allows a board to be safely inserted and removed from a live backplane by limiting the amount of inrush current to the load supply during power up.
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PRODUCT INNOVATIONS
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Curtiss-Wright Controls
New rugged single board computer
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Low-jitter, low phase noise SAW oscillator supports for high-speed interfaces
Linear Technology - PMIC
Switch mode USB power manager, buck-boost, boost & dual buck regulator
ANALYSIS-MARKET-TRENDS
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SIA - Worldwide sales of semiconductors
July chip sales up 7.6 percent Year-on-Year
IMS Research - Report
Medium voltage motor drives market grows rapidly as energy prices soar
Vishay Siliconix - MOSFETs
p-channel power MOSFETs in the PowerPAK SC-75
NEWS
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Texas Instruments - embedded systems
Texas Instruments, a key member of the IEEE working group, announced that it is driving the ratification of the IEEE 1149.7 standard, a new two-pin test and debug interface standard that supports half the number of pins of the IEEE 1149.1 technology, allowing developers to easily test and debug products with complex digital circuitry, multiple CPUs and applications software in products such as mobile and handheld communication devices.
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News - 06.09.2008
New rugged single board computer
Curtiss-Wright Controls Embedded Computing has announced the VPX3-127, a new Power Architecture-based 3U VPX (VITA 46) single board computer (SBC). The powerful, small form-factor VPX3-127 SBC is the latest addition to Curtiss-Wright´s extensive family of rugged VPX SBC and DSP engines, and brings the high-bandwidth, serial switched fabric support, and ESD protection benefits of the VPX board architecture to space and weight constrained 3U embedded applications.
Texas Instruments, a key member of the IEEE working group, announced that it is driving the ratification of the IEEE 1149.7 standard, a new two-pin test and debug interface standard that supports half the number of pins of the IEEE 1149.1 technology, allowing developers to easily test and debug products with complex digital circuitry, multiple CPUs and applications software in products such as mobile and handheld communication devices.
Texas Instruments, a key member of the IEEE working group, announced that it is driving the ratification of the IEEE 1149.7 standard, a new two-pin test and debug interface standard that supports half the number of pins of the IEEE 1149.1 technology, allowing developers to easily test and debug products with complex digital circuitry, multiple CPUs and applications software in products such as mobile and handheld communication devices.