Industrial Topics 
category PRODUCT INNOVATIONS - JTAG Technologies - scan module
Digital I/O scan module ideal for implementing boundary-scan and functional tests

JTAG Technologies has introduced the new compact JT 2149/MPV Digital I/O Scan (DIOS) module, which allows digital I/O test access to PCBs requiring external I/O stimulus and response monitoring. go


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Messe München GmbH
Messe München GmbH
category PRODUCT INNOVATIONS
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Messe München GmbH
Messe München GmbH
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JTAG Technologies
Digital I/O scan module ideal for implementing boundary-scan and functional tests go
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Fraunhofer-Institut für Werkstoffmechanik IWM
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Messe München GmbH
Messe München GmbH
category ANALYSIS-MARKET-TRENDS
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Messe München GmbH
Messe München GmbH
SEMI - book-to-bill
North American semiconductor equipment industry posts september 2008 Book-to-Bill Ratio of 0.76 go
According to iSuppli:
Electronics contract manufacturing business to stay afloat during recession go
Gartner says
Worldwide semiconductor capital equipment spending to decline 26 Percent in 2008 go
Messe München GmbH
Messe München GmbH
category NEWS
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Messe München GmbH
Messe München GmbH
Metal-free MID technology
New compound: Laser produces electrically conductive structures go
3D-SIC technology
IMEC demonstrates 3D stacked integrated circuits go
Fraunhofer ISE
39.7% – New European Record Efficiency for Solar Cells go
Messe München GmbH
Messe München GmbH
category APPLICATIONS
Messe München GmbH
Messe München GmbH
Pixargus - optical inline inspection system
Complete surface inspection of cables go