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: (114 hits)
Company
Country
ZIP
Na Bob Precision Metal
Industry Ltd
Hongkong
.
Nakagawa Electronics Limited
Hongkong
NAM HING CIRCUIT BOARD CO LTD
Hongkong
.
Nanjing Changsheng Instrument
Co., Ltd.
China
211199
Nanjing Hua Lian Xing
Electronics Co., Ltd.
China
210028
NanoAmp Solutions Inc.
USA
Nanotecture Limited
United Kingdom and Northern Ireland
Nanotron Technologies GmbH
Germany
10555
Nan Ya Plastics Corp.
Electronics Material Div.
Taiwan
105
Nan Ya Plastics Corp.
LCD Dept.
Taiwan
105
Narda Safety Test Solutions GmbH
Germany
72793
Nationaler Verband der Elektro-
technik in Bulgarien
Bulgaria
1407
National Instruments
Germany GmbH
Germany
81369
National Semiconductor GmbH
Germany
82256
National Semiconductor GmbH
Germany
82256
National Team Components
(N.T.C.)
USA
Navman Ltd.
New Zealand
NDK Nihon Dempa Kogyo Co.Ltd.
United Kingdom and Northern Ireland
NEC Electronics (Europe) GmbH
Germany
40472
NEC Tokin Europe GmbH
Germany
41460
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News - 05.09.2008
New rugged single board computer
Curtiss-Wright Controls Embedded Computing has announced the VPX3-127, a new Power Architecture-based 3U VPX (VITA 46) single board computer (SBC). The powerful, small form-factor VPX3-127 SBC is the latest addition to Curtiss-Wright´s extensive family of rugged VPX SBC and DSP engines, and brings the high-bandwidth, serial switched fabric support, and ESD protection benefits of the VPX board architecture to space and weight constrained 3U embedded applications.
Texas Instruments, a key member of the IEEE working group, announced that it is driving the ratification of the IEEE 1149.7 standard, a new two-pin test and debug interface standard that supports half the number of pins of the IEEE 1149.1 technology, allowing developers to easily test and debug products with complex digital circuitry, multiple CPUs and applications software in products such as mobile and handheld communication devices.
Texas Instruments, a key member of the IEEE working group, announced that it is driving the ratification of the IEEE 1149.7 standard, a new two-pin test and debug interface standard that supports half the number of pins of the IEEE 1149.1 technology, allowing developers to easily test and debug products with complex digital circuitry, multiple CPUs and applications software in products such as mobile and handheld communication devices.